| 标题 |
Three-dimensional imaging and tilt-angle analysis of dislocations in 4H-SiC by two-photon-excited band-edge photoluminescence |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Express 作者:Ryohei Tanuma; Masahiro Nagano; Isaho Kamata; Hidekazu Tsuchida 出版日期:2014-12-01 |
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(2025-6-4)