| 标题 |
MEDNet: Memory-Enhanced Discriminative Feature Learning for Few-Shot Metal Defect Classification |
| 网址 | |
| DOI | |
| 其它 |
期刊:IECON 2025 – 51st Annual Conference of the IEEE Industrial Electronics Society 作者:Shi Zhen; Ruiyun Yu; Haoyuan Li 出版日期:2025-11-07 |
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(2025-6-4)