| 标题 |
Ga2O3-Engineered Buried-Channel Transport in Amorphous IGZO Thin-Film Transistors with Improved Mobility and Reliability for DRAM Cell Applications |
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| DOI | |
| 其它 |
期刊:ACS Applied Materials & Interfaces 作者:Taeyoon Lee; Kwanwoo Song; Jeewon Bu; Youngmin Kim; Jun Hoe Heo; et al 出版日期:2026-09-26 |
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(2025-6-4)