| 标题 |
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities |
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| DOI | |
| 其它 |
期刊:Ultramicroscopy 作者:Leonardo Marcon Corrêa; Eduardo Ortega; Arturo Ponce; M. A. Cotta; D. Ugarte 出版日期:2024-01-23 |
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(2025-6-4)