| 标题 |
Robust Cu Dual Damascene Interconnects With Porous SiOCH Films Fabricated by Low-Damage Multi-Hard-Mask Etching Technology |
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| DOI | |
| 其它 |
期刊:IEEE transactions on semiconductor manufacturing 作者:H. Ohtake; M. Tagami; M. Tada; M. Ueki; M. Abe; et al 出版日期:2006-11-13 |
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(2025-6-4)