| 标题 |
Nondestructive analysis of interface damage and stress in Al-ion implanted 4H-SiC homoepitaxial wafers via micro-Raman and multiscale simulation |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applications of Surface Science 作者:Zhoudong Yang; Yuanhui Zuo; Xinyue Wang; Hong Zhou; Hongyu Tang; et al 出版日期:2025-01-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)