| 标题 |
Dependence of HCI mechanism on temperature for 0.18 μm technology and beyond |
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| DOI | |
| 其它 |
期刊:1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) 作者: Weizhong Wang; Jiang Tao; Peng Fang 出版日期:2003-01-22 |
| 求助人 | |
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(2025-6-4)