| 标题 |
X-Ray Computed Tomography (CT) Technology for Detecting Battery Defects and Revealing Failure Mechanisms |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Electronic Materials 作者:Yingjie Jiang; Anqi Tian; Yan Li; Xueqi Du; Lanmei Yang; et al 出版日期:2024-07-27 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)