| 标题 |
[高分]
VIA Reliability Evaluation of Embedded MLCC through Pressure Cooker Test |
| 网址 | |
| DOI |
10.12783/dtetr/icmeit2018/23384
doi
|
| 其它 |
期刊:DEStech Transactions on Engineering and Technology Research 作者:Hwa-sun PARK; Young-il NA; Ho-joon CHOI; Dae-seok SEO; Yong-soo OH; et al 出版日期:2018-06-20 |
| 求助人 | |
| 下载 |
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(2025-6-4)