| 标题 |
The effect of silicon anisotropy on the thermal stress of TSV structure of 3D packaging chip under thermal cyclic loads |
| 网址 | |
| DOI | |
| 其它 |
期刊:International Conference on Electronic Packaging Technology 作者:Jingyang Liang; Minjie Ning; Chao Ding; Tianhan Liu; Zongbei Dai; et al 出版日期:2021-09-14 |
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(2025-6-4)