| 标题 |
Gas cluster ion beam processing for improved self aligned contact yield at 7 nm node FinFET: MJ: MOL and junction interfaces |
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| 其它 |
期刊:2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) 作者:Su Chen Fan; Sean Teehan; Kisup Chung; Alex Varghese; Mark Lenhardt; et al 出版日期:2018-06-22 |
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(2025-6-4)