| 标题 |
Electromigration Failure Study of a Fine-pitch 2μm/2μm L/S Cu Redistribution Line Embedded in Polyimide for Advanced High-density Fan-out Packaging |
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| DOI | |
| 其它 |
期刊:2020 IEEE 70th Electronic Components and Technology Conference (ECTC) 作者:Chien-Lung Liang; Yung-Sheng Lin; Chin-Li Kao; David Tarng; Shan-Bo Wang; et al 出版日期:2020-06-01 |
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(2025-6-4)