| 标题 |
Standard-cell design architecture options below 5nm node: The ultimate scaling of FinFET and Nanosheet |
| 网址 | |
| DOI | |
| 其它 |
期刊:Design-Process-Technology Co-optimization for Manufacturability XIII 作者:Syed Muhammad Yasser Sherazi; Miroslav Cupak; Pieter Weckx; Odysseas Zografos; Doyoung Jang; et al 出版日期:2019 |
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(2025-6-4)