| 标题 |
A review of the geometrical fundamentals of reflection high-energy electron diffraction with application to silicon surfaces |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 作者:John E. Mahan; Kent M. Geib; G. Y. Robinson; Robert G. Long 出版日期:1990-09-01 |
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(2025-6-4)