| 标题 |
The electron trap parameter extraction-based investigation of the relationship between charge trapping and activation energy in IGZO TFTs under positive bias temperature stress |
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| DOI | |
| 其它 |
期刊:Solid-state Electronics 作者:J. Rhee; S. Choi; Hara Kang; Jae-Young Kim; D. Ko; et al 出版日期:2017-10-01 |
| 求助人 | |
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(2025-6-4)