| 标题 |
Simultaneous low-frequency noise characterization of gate and drain currents in AlGaN/GaN high electron mobility transistors |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Hemant Rao; Gijs Bosman 出版日期:2009-11-15 |
| 求助人 | |
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(2025-6-4)