| 标题 |
Classification and evaluation for nearside/backside defect via magnetic flux leakage: A dual probe design with SVM and PSO intelligence algorithms |
| 网址 | |
| DOI | |
| 其它 |
期刊:NDT & E international 作者:Pengpeng Shi; Pengcheng Zhang; Shuai Hao; Wenshuai Wang; Xiaofan Gou 出版日期:2024-03-24 |
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(2025-6-4)