| 标题 |
Power-On Reset Circuit in 180-nm CMOS With Brownout Detection, Stable Switching Points, Long Reset Pulse Duration, and Resilience to Switching Noise |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Very Large Scale Integration (VLSI) Systems 作者:Andrei A. Antonov; Maksim S. Karpovich; Vladislav Yu Vasilyev 出版日期:2022 |
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(2025-6-4)