| 标题 |
Immobilization of partial dislocations bounding double Shockley stacking faults in 4H-SiC observed by in situ synchrotron X-ray topography |
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| 其它 |
期刊:Materialia 作者:Fumihiro Fujie; Shunta Harada; Hiromasa Suo; Balaji Raghothamachar; Michael Dudley; et al 出版日期:2021-12-01 |
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(2025-6-4)