| 标题 |
Plasma etching of the trench pattern with high aspect ratio mask under ion tilting |
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| DOI | |
| 其它 |
期刊:Applied Surface Science 作者:Min Young Yoon; H.J. Yeom; Jung Hyung Kim; Jong-Ryul Jeong; Hyo-Chang Lee 出版日期:2022-09-01 |
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(2025-6-4)