| 标题 |
Simultaneous ion and electron beam etching for charge-free and low-damage silicon processing |
| 网址 | |
| DOI | |
| 其它 |
期刊:Plasma Sources Science and Technology 作者:Gaae Kim; Min-Seok Kim; Chin-Wook Chung 出版日期:2026 |
| 求助人 | |
| 下载 |
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(2025-6-4)