| 标题 |
Effect of Pt Seed-Layer Thickness and Annealing on the Interfacial Reaction and Contact Resistivity of p⁺-In0.53Ga0.47As |
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| DOI | |
| 其它 |
期刊:Electronic Materials Letters 作者:Jongchan Ryu; Hongju Kim; Young-Ho Chu; Seongheon Kim; Yongmin Baek; et al 出版日期:2025-11-28 |
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(2025-6-4)