| 标题 |
Metallization of Helium-Hermetic and Thermo-Mechanically Reliable Through Glass Vias (TGV) by Conformal Pinched Via (CPV) Approach |
| 网址 | |
| DOI | |
| 其它 |
期刊:2025 IEEE 75th Electronic Components and Technology Conference (ECTC) 作者:Mandakini Kanungo; Rajesh Vaddi; Chukwudi Okoro; Scott Pollard; Prantik Mazumder 出版日期:2025-06-27 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)