| 标题 |
Investigation of dual work function metal (DWFM) gate stacks with ALD TaAlN and TaAlC for multi threshold voltages (VTHs) engineering in MOS device integration |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Moonsuk Choi; Jihyeon Sim; Hyeongjun Kim; Hyun Jin Lim; Ki Sub Kim; Changhwan Choi 出版日期:2024-03-21 |
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(2025-6-4)