| 标题 |
High quality relaxed germanium layers grown on (110) and (111) silicon substrates with reduced stacking fault formation |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Van‐Huy Nguyen; A. Dobbie; M. Myronov; D. R. Leadley 出版日期:2013-10-17 |
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(2025-6-4)