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Extended lifetime qualification concepts for automotive semiconductorcomponents
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Current automotive megatrends electro mobility, digitalization and autonomous driving lead to more demanding reliability requirements for automotive semiconductors. The most significant change applies to the operating time, which increases at least by a factor four. In this work, a typical new mission profile is used to highlight that the established qualification procedure using standardized stress test conditions, the AEC-Q100, is not sufficient to proof fulfillment of these new life-cycle requirements. Different solutions to extend the existing standard to cover the new requirements are discussed. Those are extended test conditions, Robustness Validation and standardized extended lifetime requirements (SELR). |
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(2025-6-4)
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