| 标题 |
High Current Density Effect on In-situ Atomic Migration Characteristics of a BiTe Thin Film System |
| 网址 | |
| DOI | |
| 其它 |
期刊:Japanese Journal of Applied Physics 作者:Seung‐Hyun Kim; Yong-Jin Park; Young‐Chang Joo; Young-Bae Park 出版日期:2013-10-01 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)