| 标题 |
Modeling of polarization state change induced by off-axis reflective objectives for beam focusing in spectroscopic ellipsometry |
| 网址 | |
| DOI |
10.1117/12.3025291
doi
|
| 其它 |
期刊:Metrology, Inspection, and Process Control XXXVIII 作者:Tae Dong Kang; Daewon Kwon; Inhee Joh; Myeongrok Oh; Mita Park; et al 出版日期:2024-02-24 |
| 求助人 | |
| 下载 |
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(2025-6-4)