| 标题 |
Influence of the thickness of a SiO2 reflective layer on the performance of a structured CsI(Tl) scintillation screen based on an oxidized Si micropore array template in X-ray imaging |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optics Express 作者:Zhixiang Sun; Mu Gu; Yunxue Teng; Xiaolin Liu; Bo Liu; et al 出版日期:2022 |
| 求助人 | |
| 下载 |
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(2025-6-4)