| 标题 |
WARP: Workload-Aware Reference Prediction for Reliable Multi-Bit FeFET Readout under Charge-Trapping Degradation* |
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| DOI | |
| 其它 |
期刊:2026 31st Asia and South Pacific Design Automation Conference (ASP-DAC) 作者:Dhruv Thapar; Ashish Reddy Bommana; Arjun Chaudhuri; Kai Ni; Krishnendu Chakrabarty 出版日期:2026-01-19 |
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(2025-6-4)