| 标题 |
Evaluation of ultra-low specific contact resistance extraction by cross-bridge Kelvin resistor structure and transmission line method structure |
| 网址 | |
| DOI | |
| 其它 |
期刊:2014 International Conference on Microelectronic Test Structures (ICMTS) 作者:Bing-Yue Tsui; Hsuan-Tzu Tseng 出版日期:2014-07-29 |
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(2025-6-4)