| 标题 |
Stochastic simulation of pattern formation for chemically amplified resist in electron beam lithography |
| 网址 | |
| DOI | |
| 其它 |
期刊:Japanese Journal of Applied Physics 作者:M. Koyama; M. Shirai; H. Kawata; Y. Hirai; M. Yasuda 出版日期:2019-05-06 |
| 求助人 | |
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(2025-6-4)