| 标题 |
The Impact of Strain Relaxation on the Hole Mobility in Biaxially Strained-Ge/SiGe pMOSFETs |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:Ke Zhou; Ruocheng Yang; Lingfeng Zhu; Wenhao Zhang; Dawei Gao; et al 出版日期:2026-03-01 |
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(2025-6-4)