| 标题 |
Effects of SiO2 cap annealing on MOS interfaces formed on Mg-doped p-type GaN surface |
| 网址 | |
| DOI | |
| 其它 |
期刊:Japanese Journal of Applied Physics 作者:Yining Jiao; Masanobu Takahashi; Taketomo Sato; Masamichi Akazawa 出版日期:2024-09-02 |
| 求助人 | |
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(2025-6-4)