| 标题 |
2D axisymmetric modeling of femtosecond laser ablation in silicon: coupling transient carrier dynamics with phase explosion-induced morphology evolution |
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| DOI | |
| 其它 |
期刊:The International Journal of Advanced Manufacturing Technology 作者:Heng-Zhi Yang; Toni Yuhandri; Yu-Lung Lo 出版日期:2026-07-16 |
| 求助人 | |
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(2025-6-4)