Atomic Force Microscopy and its Applications in Secondary Batteries

Atomic Force microscope (AFM) not only reveals the surface morphology of substances at the nanoscale and molecular level but also enables the measurement of extremely weak forces, which allows for the study of weak interactions between molecules. Moreover, the AFM possesses certain spatial resolution ability. As a valuable tool in secondary battery research, AFM could reveal the surface microscopic morphology of the electrode in real time through the interaction between atoms from the tip and the electrode surface. It offers nanoscale surface information of the electrode from both chemical and physical perspectives, thus establishing essential guidance for further modification of electrode materials and electrolytes. This chapter reviews the state-of-art application progress of AFM in the study of secondary batteries, including cathode materials, anode materials and solid electrolyte interface.