石墨烯
石墨
材料科学
剥脱关节
拉曼光谱
氧化石墨烯纸
杂质
超声
复合材料
石墨烯泡沫
纳米技术
样品制备
电极
基质(水族馆)
化学工程
色谱法
化学
光学
工程类
物理化学
地质学
物理
有机化学
海洋学
作者
Ki‐Yeol Kim,Joonkyu Park,Chunglee Kim,WooSeok Choi,Yongho Seo,Jinho Ahn,In‐Sung Park
出处
期刊:Micro & Nano Letters
[Institution of Engineering and Technology]
日期:2012-11-30
卷期号:7 (11): 1133-1135
被引量:5
标识
DOI:10.1049/mnl.2012.0627
摘要
A study is presented into how to remove impurities generated in the graphene sample preparation process using mechanical exfoliation. Almost all of the impurities on an exfoliated graphene sample are graphite flakes or thick stacks of graphene. Large flakes of graphite are problematic sources in the measurement of graphene device properties, as they might cause an electrical short between electrodes on the graphene device. The heating was adapted followed by ultrasonic cleaning to remove graphite flakes among various cleaning methods. The major goal of the presented method is to remove graphite flakes, whereas single-layer graphenes should remain on the substrate not to be damaged. Using a statistical approach of cleaned particles, the efficiency of the cleaning method was analysed. As a result, the heating and sonication method was efficient to remove large and thick flakes on substrates. From Raman spectroscopy the sample was confirmed to be intact.
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