领域(数学)
X射线荧光
计算机科学
数据科学
校准
纳米技术
材料科学
荧光
物理
数学
光学
纯数学
量子力学
作者
Damian Kobylarz,Agata Michalska,Kamil Jurowski
标识
DOI:10.1016/j.trac.2023.117355
摘要
FP-XRF (field portable X-Ray Fluorescence Spectroscopy) is a powerful tool for element determination, both quantitatively and qualitatively. FP-XRF due to its rapid, non-destructive, and cost-effective nature is crucial in forensic sciences where evidence preservation is essential. However, analytical calibration poses a significant challenge. These devices incorporate computational algorithms, but their use remains controversial, resulting in the technique being semi-quantitative. The article aims to review the versatile use of FP-XRF as a valuable forensic analysis tool. With its innovation, affordability, speed, non-destructive nature, and ability to perform in situ analysis, FP-XRF is becoming increasingly important. This review addresses the lack of a comprehensive summary and critical analysis of FP-XRF's role in forensic analyzes. We believe as technology continues to advance, it is likely that FP-XRF will become even more important and popular in the field of forensic sciences.
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