K. Rajagopalan,J. Abrokwah,Ravi Droopad,M. Passlack
出处
期刊:IEEE Electron Device Letters [Institute of Electrical and Electronics Engineers] 日期:2006-12-01卷期号:27 (12): 959-962被引量:66
标识
DOI:10.1109/led.2006.886319
摘要
This letter introduces the first enhancement-mode GaAs n-channel MOSFETs with a high channel mobility and an unpinned Fermi level at the oxide/GaAs interface. The NMOSFETs feature an In 0.3 Ga 0.7 As channel layer, a channel mobility of up to 6207 cm 2 /Vmiddots, and a dielectric stack thickness of 13.1-18.7 nm. Enhancement-mode NMOSFETs with a gate length of 1 mum, a source/drain spacing of 3 mum, and a threshold voltage of 0.05 V show a saturation current, transconductance, on-resistance, and subthreshold swing of 243 mA/mm, 81 mS/mm, 8.0 Omegamiddotmm, and 162 mV/dec, respectively