倒装芯片
分层(地质)
材料科学
复合材料
可靠性(半导体)
粘附
集成电路封装
基质(水族馆)
炸薯条
电子工程
胶粘剂
光电子学
集成电路
图层(电子)
工程类
电气工程
古生物学
俯冲
构造学
物理
生物
量子力学
地质学
海洋学
功率(物理)
作者
Zi-Ying Oh,R. Newman,M. C. Ong,Fang Jie Foo
标识
DOI:10.1109/ipfa.2012.6306258
摘要
Interfacial adhesion is critical to the reliability of flip-chip packages. A series of DOE studies were done to ensure and enhance the underfill-to-soldermask adhesion. It was found that vibration testing is most effective in simulating underfill-to-soldermask delamination. A rougher substrate soldermask surface and assembly with cleanable flux improves underfill-to-soldermask adhesion.
科研通智能强力驱动
Strongly Powered by AbleSci AI