插层(化学)
石墨烯
材料科学
带隙
纳米技术
光电子学
化学
无机化学
作者
Jonas Warmuth,Albert Bruix,Matteo Michiardi,Torben Hänke,Marco Bianchi,Jens Wiebe,R. Wiesendanger,Bjørk Hammer,Philip Hofmann,Alexander A. Khajetoorians
出处
期刊:Physical review
[American Physical Society]
日期:2016-04-27
卷期号:93 (16)
被引量:34
标识
DOI:10.1103/physrevb.93.165437
摘要
We report on the structural and electronic properties of a single bismuth\nlayer intercalated underneath a graphene layer grown on an Ir(111) single\ncrystal. Scanning tunneling microscopy (STM) reveals a hexagonal surface\nstructure and a dislocation network upon Bi intercalation, which we attribute\nto a $\\sqrt{3}\\times\\sqrt{3}R30{\\deg}$ Bi structure on the underlying Ir(111)\nsurface. Ab-initio calculations show that this Bi structure is the most\nenergetically favorable, and also illustrate that STM measurements are most\nsensitive to C atoms in close proximity to intercalated Bi atoms. Additionally,\nBi intercalation induces a band gap ($E_g=0.42\\,$eV) at the Dirac point of\ngraphene and an overall n-doping ($\\sim 0.39\\,$eV), as seen in angular-resolved\nphotoemission spectroscopy. We attribute the emergence of the band gap to the\ndislocation network which forms favorably along certain parts of the moir\\'e\nstructure induced by the graphene/Ir(111) interface.\n
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