碳化硅
功率MOSFET
工程物理
功率半导体器件
MOSFET
材料科学
结温
电气工程
可靠性(半导体)
电源模块
功率(物理)
电子工程
转换器
电压
工程类
晶体管
物理
量子力学
冶金
作者
Catherine Langpoklakpam,An-Chen Liu,Kuo-Hsiung Chu,Lung-Hsing Hsu,Wen‐Chung Lee,Shih-Chen Chen,Chia‐Wei Sun,Min‐Hsiung Shih,Kung‐Yen Lee,Hao‐Chung Kuo
出处
期刊:Crystals
[Multidisciplinary Digital Publishing Institute]
日期:2022-02-11
卷期号:12 (2): 245-245
被引量:163
标识
DOI:10.3390/cryst12020245
摘要
Owing to the superior properties of silicon carbide (SiC), such as higher breakdown voltage, higher thermal conductivity, higher operating frequency, higher operating temperature, and higher saturation drift velocity, SiC has attracted much attention from researchers and the industry for decades. With the advances in material science and processing technology, many power applications such as new smart energy vehicles, power converters, inverters, and power supplies are being realized using SiC power devices. In particular, SiC MOSFETs are generally chosen to be used as a power device due to their ability to achieve lower on-resistance, reduced switching losses, and high switching speeds than the silicon counterpart and have been commercialized extensively in recent years. A general review of the critical processing steps for manufacturing SiC MOSFETs, types of SiC MOSFETs, and power applications based on SiC power devices are covered in this paper. Additionally, the reliability issues of SiC power MOSFET are also briefly summarized.
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