A Dynamic Resistive Temperature Sensor With Fully Integrated Corrections

This letter presents a dynamic resistive temperature sensor for IoT ambient temperature monitoring applications. The sensor integrates on-chip analog offset, gain, and nonlinearity correction techniques with state-of-the-art power and size performance. By shifting the reset phase of the ADC, analog offset correction is realized. By adding programmable capacitors, gain errors are corrected. By presetting and resetting a small capacitor array, the systematic nonlinearity error is mitigated. A piecewise linear approximation is adopted to reduce overhead. The temperature sensor achieves +0.7°C/-0.6°C accuracy with 2.98 pJ/conversion and 0.0023 mm2, including all corrections, resulting in a resolution FoM of 0.66 pJ K2.