材料科学
薄膜
极化(电化学)
电场
光电子学
铁电性
电容器
电介质
热稳定性
复合材料
电压
储能
磁滞
热的
薄膜电容器
响应度
温度循环
工程物理
工作温度
保温
极化密度
切换时间
介电损耗
铁电聚合物
压电
作者
Li Li,Ying Wang,Hanfei Zhu,Xinran Li,Wenye Zhai,Haijian Wang,Ying Liu,Zhongshuo Xia,Jun Ouyang
标识
DOI:10.1142/s2010135x26500086
摘要
Developing dielectric thin-film capacitors that simultaneously achieve high energy density, high efficiency, and excellent energy-storage stability represents a challenge in advancing highly integrated pulsed-power and power-electronic technologies. While conventional ferroelectric thin films possess high maximum polarization, their large remanent polarization and low breakdown field strength hamper their overall energy-storage performance. In this study, a sandwich BaTiO 3 /BiFeO 3 /BaTiO 3 (BTO/BFO/BTO) thin film was successfully fabricated at a reduced thermal budget of less than 500 ∘ C. This sandwich film exhibits a unique electric field-dependent polarization evolution, that is, it shows antiferroelectric-like polarization behavior under low-to-medium electric fields, which gradually evolves into a slim polarization response characteristic with a high maximum polarization value as the applied electric field increases. Such the antiferroelectric-like-to-ferroelectric evolution driven by the symmetric dual-interface effect of this sandwich structure, enables the synergistic regulation of polarization, breakdown strength, and hysteresis loss. Consequently, this sandwich film delivers enhanced energy-storage performance, achieving a recoverable energy density ([Formula: see text]) of 96.2[Formula: see text]J/cm 3 and an efficiency of 78%, alongside an enhanced energy-storage responsivity ([Formula: see text]) of 233.4[Formula: see text]J/(kV[Formula: see text] ⋅ [Formula: see text]m 2 ). What’s more, the film exhibits good energy-storage stability across a wide temperature range (RT [Formula: see text]C), over a broad frequency band ([Formula: see text] [Formula: see text]kHz), and throughout prolonged cycling test (up to 10 9 ). This work, which modulates polarization behavior via interface engineering to achieve superior overall energy-storage performance at a moderate-to-low thermal budget, provides significant experimental and theoretical insights for developing silicon-process-compatible, highly reliable, and integrated energy-storage devices.
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