X-ray imaging scintillator: Tb3+-doped oxyfluoride aluminosilicate glass

Scintillators are considered as a vital component for X-ray imaging due to their ability to convert X-ray into visible light. We synthesized Tb3+-doped oxyfluoride aluminosilicate glass scintillators by conditional melt-quenching method. These glass scintillators possess outstanding optical and scintillating properties. All glass scintillators have high transparency (exceed 83.3% at 475 nm), excellent internal quantum yield and suitable lifetime. The integrated luminescent intensity of optimal specimen excited by X-ray is about 224% compared to Bi4Ge3O12 crystal. The optimal glass scintillator has a good stability after continuous X-ray irradiation and exhibits profound spatial resolution in X-ray image (20 lp·mm−1). All outcomes demonstrate that Tb3+-doped oxyfluoride aluminosilicate glass scintillators have potential application for static X-ray imaging.