薄脆饼
半导体
数码产品
比例(比率)
材料科学
纳米技术
光电子学
物理
电气工程
工程类
量子力学
作者
Xingchao Zhang,Lanying Zhou,Shuopei Wang,Tong Li,Hongyue Du,Yuchao Zhou,Jieying Liu,Jiaojiao Zhao,Liang‐Feng Huang,Hua Yu,Peng Chen,Na Li,Guangyu Zhang
标识
DOI:10.1038/s41467-025-59803-1
摘要
Two-dimensional (2D) semiconductors hold a great promise for next-generation electronics. Yet, achieving a clean and intact transfer of 2D films on device-compatible substrates remains a critical challenge. Here, we report an approach that uses selenium (Se) as the intermediate layer to facilitate the transfer of wafer-scale molybdenum disulfide (MoS2) monolayers on target substrates with high surface/interface cleanness and structural integrity. Our method enables nearly 100% film intactness of the transferred 2D semiconductors which are free from residues or contaminants. Characterizations reveal that the Se-assisted dry-transfer yields MoS2 film with superior quality compared to conventional transfer techniques. The fabricated field-effect transistors (FETs) and logic circuits based on these transferred films demonstrate remarkable electrical performance, including on/off current ratios up to 2.7×1010 and electron mobility of 71.3 cm2·V-1·s-1 for individual FETs. Our results underscore the feasibility of this dry-transfer technology for fabricating high-performance 2D electronics that are fully compatible with standard semiconductor processes, paving the way for integrating 2D materials into advanced electronic applications. The transfer of 2D semiconductor films remains a challenging step in the fabrication of industry-compatible 2D electronics. Here, the authors report a method based on a Se intermediate layer to facilitate the transfer of wafer-scale MoS2 monolayers with nearly 100% film intactness and superior surface/interface cleanness, leading to an improved electrical performance of the devices.
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