材料科学
电阻率和电导率
光电子学
电导率
带隙
透射电子显微镜
脉冲激光沉积
化学气相沉积
兴奋剂
电子迁移率
透明导电膜
宽禁带半导体
分析化学(期刊)
薄膜
纳米技术
化学
物理化学
色谱法
电气工程
工程类
作者
Hyung Min Jeon,Kevin Leedy,D. C. Look,Celesta S. Chang,David A. Muller,Ştefan C. Bǎdescu,Vladimir Vasilyev,Jeff L. Brown,Andrew J. Green,Kelson D. Chabak
出处
期刊:APL Materials
[American Institute of Physics]
日期:2021-10-01
卷期号:9 (10)
被引量:38
摘要
Conductive homoepitaxial Si-doped β-Ga2O3 films were fabricated by pulsed laser deposition with an as-deposited 2323 S cm−1 conductivity (resistivity = 4.3 × 10−4 Ω-cm, carrier concentration = 2.24 × 1020 cm−3, mobility = 64.5 cm2 V−1 s−1, and electrical activation efficiency = 77%). High quality homoepitaxial films deposited on commercial (010) Fe-compensated β-Ga2O substrates were determined by high-resolution transmission electron microscopy and x-ray diffraction. The β-Ga2O3 films have ∼70% transparency from 3.7 eV (335 nm) to 0.56 eV (2214 nm). The combination of high conductivity and transparency offers promise for numerous ultrawide bandgap electronics and optoelectronic applications.
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