薄膜
钙钛矿(结构)
材料科学
铁电性
图层(电子)
氧化物
制作
缓冲器(光纤)
电极
化学工程
光电子学
纳米技术
化学
冶金
电气工程
电介质
工程类
病理
物理化学
医学
替代医学
作者
Tomoya Sato,Daichi Ichinose,Junichi Kimura,Takaaki Inoue,Takanori Mimura,Hiroshi Funakubo,Kiyoshi Uchiyama
标识
DOI:10.7567/jjap.55.10ta19
摘要
Abstract BaCe 0.9 Y 0.1 O 3−δ (BCYO) and SrZr 0.8 Y 0.2 O 3−δ (SZYO) thin films of perovskite-type oxides were deposited on (111)Pt/TiO x /SiO 2 /(100)Si substrates. X-ray diffraction patterns showed that the (110)-oriented BCYO and SZYO thin films were grown on (111)Pt/Si substrates directly without using any buffer layers. Thin films of SrRuO 3 (SRO), a conductive perovskite-type oxide, were also deposited on those films and highly (110)-oriented SRO thin films were obtained. We believe that this (110)-oriented SRO works as a buffer layer to deposit (110)-oriented perovskite-type ferroelectric oxide thin films as well as a bottom electrode and can modify the ferroelectric properties of the oxide thin films by controlling their crystallographic orientations.
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