Microstructure-electrochemical behavior relationship in post processed AISI316L stainless steel parts fabricated by laser powder bed fusion

材料科学 残余应力 表面粗糙度 微观结构 扫描电子显微镜 介电谱 电子背散射衍射 复合材料 抛光 冶金 电化学 电极 物理化学 化学
作者
Amir Behjat,M. Shamanian,Aboozar Taherizadeh,Erika Lannunziata,Sara Bagherifard,Elżbieta Gadalińska,Abdollah Saboori,Luca Iuliano
出处
期刊:Journal of materials research and technology [Elsevier BV]
卷期号:23: 3294-3311 被引量:17
标识
DOI:10.1016/j.jmrt.2023.01.229
摘要

AISI316L stainless steel components produced via additive manufacturing techniques have quickly found new applications across several industrial sectors. However, parts manufactured through this method generally exhibit poor surface quality and performance in the as-built state. This work addresses the influence of laser polishing and water jet assisted recirculating shot peening on the surface quality, microstructure and electrochemical properties of AISI316L samples produced by the laser powder bed fusion method. To do so, surface roughness analysis, residual stress measurement, scanning electron microscope and electron backscatter diffraction analysis were employed along with electrochemical tests, including cyclic potentiodynamic polarization, electrochemical impedance spectroscopy and Mott-Schottky analysis. Laser polished samples exhibited a smooth surface with high tensile residual stress on the surface, which led to the reduction of pitting potential and formation of passive layers, including more crystal defects. Microscopical analysis evidenced that the higher density of lattice defects and local microstrain on the surface of the shot peened samples promoted surface hardness and induced compressive residual stress. Therfore, the shot peened samples exhibited a wider passive range in cyclic potentiodynamic polarization measurements, higher polarization resistance in electrochemical impedance spectroscopy measurements, and less defective passive film in Mott-Schottky analysis. Moreover, it was calculated that the passive film thickness of the shot peened sample was slightly larger than the other samples. Low surface roughness, high crystal defect density, and compressive residual stresses enhanced the passive layer's resistance to defect transport, lowered the point defect concentration in the passive film, and improved the pitting resistance of the samples.
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