记忆电阻器
神经形态工程学
电阻随机存取存储器
材料科学
瓶颈
冯·诺依曼建筑
锑
硫系化合物
纳米技术
电导率
纳米结构
导电体
热传导
非易失性存储器
随机存取存储器
光电子学
计算机科学
电子工程
人工神经网络
物理
电极
人工智能
复合材料
工程类
量子力学
计算机硬件
冶金
嵌入式系统
操作系统
作者
Yuanjie Yang,Yuanhui Yang,Lei Zheng,Yuchan Wang,Fang Wang,Xiaolei Li,Liangliang Feng,Hongling Guo,Shifu Xiong,Kailiang Zhang
标识
DOI:10.1021/acs.jpclett.4c03367
摘要
Advancing the development of novel materials or architectures for random access memories, coupled with an in-depth understanding of their intrinsic conduction mechanisms, holds the potential to transcend the conventional von Neumann bottleneck. In this work, a novel memristor based on the Sb2(S,Se)3 material with an alloy of S and Se was fabricated. A systematic investigation of the correlation between the Se/(S + Se) ratio and memristive performance revealed that Ag/Sb2(S,Se)3/FTO memristive behavior is uniquely associated with the formation and disruption of anion vacancies and silver filaments. The resultant Ag/Sb2(S,Se)3/FTO memristor devices demonstrated good resistive switching, with durability surpassing 3 × 104 cycles, showcasing multilevel conductivity states. Furthermore, these devices successfully emulated the synaptic functionality. This research has established the foundation for the intrinsic conduction mechanisms of antimony chalcogenide memristor artificial synapses.
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